Advanced Techniques For Materials Characterization
Introduction: Need of advanced materials characterization and available techniques.

Electron Microscopy: Interaction of electrons with solids, Scanning electron microscopy transmission electron microscopy and specimen preparation techniques, Scanning transmission electron microscopy, Electron energy loss spectroscopy, Energy dispersive spectroscopy, Wavelength dispersive spectroscopy.

Diffraction Methods: Fundamental crystallography, Generation and detection of X-rays, Diffraction of X-rays, X-ray diffraction techniques, Electron diffraction, Neutron diffraction.

Surface Analysis: Atomic force microscopy, Scanning tunneling microscopy, Secondary ion mass spectrometry, Auger electron spectroscopy, X-ray photoelectron spectroscopy.

Resonance Methods: Nuclear magnetic resonance, Mossbauer spectroscopy.

Spectroscopy: Optical emission spectroscopy, Atomic absorption spectroscopy, UV/Visible spectroscopy, Spark source mass spectrometry, Raman spectroscopy, Infrared spectroscopy, Fourier transform infrared spectroscopy, X-ray fluorescence, Inductively coupled plasma emission spectroscopy, Rutherford backscattering spectroscopy.

Chromatography: Gas chromatography, Liquid chromatography, Ion chromatography.

Recommended Books:
  • Gabriel, B. SEM- A Users’s Manual, Plenum Press (1985).
  • Cullity, B.D. Elements of X-Ray Diffraction, Addison Wesley (1967).
  • Smallman, R.E., and Bishop, R.J., Metals and Materials – Science, Processes, Applications, Butterworth-Heinemann (1995).
  • Sibilia J.P., A Guide to Materials Characterisation and Chemical Analysis, VCH (1988).